h1

001010853 001__ 1010853
001010853 005__ 20251020155931.0
001010853 0247_ $$2ISSN$$a0021-8979
001010853 0247_ $$2ISSN$$a0148-6349
001010853 0247_ $$2ISSN$$a1089-7550
001010853 0247_ $$2ISSN$$a2163-5102
001010853 0247_ $$2WOS$$aWOS:001482986000015
001010853 0247_ $$2datacite_doi$$a10.18154/RWTH-2025-04378
001010853 0247_ $$2doi$$a10.1063/5.0262843
001010853 0247_ $$2SCOPUS$$aSCOPUS:2-s2.0-105004194383
001010853 037__ $$aRWTH-2025-04378
001010853 041__ $$aEnglish
001010853 082__ $$a530
001010853 1001_ $$0P:(DE-82)IDM04026$$aKopperberg, Nils$$b0$$urwth
001010853 245__ $$a3D kinetic Monte Carlo-based investigation of the influence of dopants on the reliability of VCM ReRAM$$honline, print
001010853 260__ $$aMelville, NY$$bAmerican Inst. of Physics$$c2025
001010853 300__ $$a1-9
001010853 3367_ $$00$$2EndNote$$aJournal Article
001010853 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal
001010853 3367_ $$2BibTeX$$aARTICLE
001010853 3367_ $$2DRIVER$$aarticle
001010853 3367_ $$2DataCite$$aOutput Types/Journal article
001010853 3367_ $$2ORCID$$aJOURNAL_ARTICLE
001010853 536__ $$0G:(DE-82)BMBF-16ME0399$$aBMBF 16ME0399 - Verbundprojekt: Neuro-inspirierte Technologien der künstlichen Intelligenz für die Elektronik der Zukunft - NEUROTEC II - (BMBF-16ME0399)$$cBMBF-16ME0399$$x0
001010853 536__ $$0G:(DE-82)BMBF-16ME0398K$$aBMBF 16ME0398K - Verbundprojekt: Neuro-inspirierte Technologien der künstlichen Intelligenz für die Elektronik der Zukunft - NEUROTEC II - (BMBF-16ME0398K)$$cBMBF-16ME0398K$$x1
001010853 588__ $$aDataset connected to CrossRef, Journals: publications.rwth-aachen.de
001010853 591__ $$aGermany
001010853 7001_ $$0P:(DE-82)1011001$$aGenua Noguera, Daniel$$b1$$urwth
001010853 7001_ $$00000-0002-4258-2673$$aMenzel, S.$$b2$$eCorresponding author
001010853 773__ $$0PERI:(DE-600)1476463-5$$a10.1063/5.0262843$$n17$$p175105$$tJournal of applied physics$$v137$$x1089-7550$$y2025
001010853 8564_ $$uhttps://publications.rwth-aachen.de/record/1010853/files/1010853.pdf$$yOpenAccess
001010853 909CO $$ooai:publications.rwth-aachen.de:1010853$$pVDB$$pdnbdelivery$$pdriver$$popen_access$$popenaire
001010853 9151_ $$0StatID:(DE-HGF)0031$$2StatID$$aPeer reviewed article$$x0
001010853 915__ $$0LIC:(DE-HGF)CCBY4$$2HGFVOC$$aCreative Commons Attribution CC BY 4.0
001010853 915__ $$0StatID:(DE-HGF)0030$$2StatID$$aPeer Review$$bASC$$d2024-12-18
001010853 915__ $$0StatID:(DE-HGF)0100$$2StatID$$aJCR$$bJ APPL PHYS : 2022$$d2024-12-18
001010853 915__ $$0StatID:(DE-HGF)0113$$2StatID$$aWoS$$bScience Citation Index Expanded$$d2024-12-18
001010853 915__ $$0StatID:(DE-HGF)0150$$2StatID$$aDBCoverage$$bWeb of Science Core Collection$$d2024-12-18
001010853 915__ $$0StatID:(DE-HGF)0160$$2StatID$$aDBCoverage$$bEssential Science Indicators$$d2024-12-18
001010853 915__ $$0StatID:(DE-HGF)0199$$2StatID$$aDBCoverage$$bClarivate Analytics Master Journal List$$d2024-12-18
001010853 915__ $$0StatID:(DE-HGF)0200$$2StatID$$aDBCoverage$$bSCOPUS$$d2024-12-18
001010853 915__ $$0StatID:(DE-HGF)0300$$2StatID$$aDBCoverage$$bMedline$$d2024-12-18
001010853 915__ $$0StatID:(DE-HGF)0430$$2StatID$$aNational-Konsortium$$d2024-12-18$$wger
001010853 915__ $$0StatID:(DE-HGF)0510$$2StatID$$aOpenAccess
001010853 915__ $$0StatID:(DE-HGF)0600$$2StatID$$aDBCoverage$$bEbsco Academic Search$$d2024-12-18
001010853 915__ $$0StatID:(DE-HGF)1150$$2StatID$$aDBCoverage$$bCurrent Contents - Physical, Chemical and Earth Sciences$$d2024-12-18
001010853 915__ $$0StatID:(DE-HGF)1230$$2StatID$$aDBCoverage$$bCurrent Contents - Electronics and Telecommunications Collection$$d2024-12-18
001010853 915__ $$0StatID:(DE-HGF)9900$$2StatID$$aIF < 5$$d2024-12-18
001010853 9141_ $$y2025
001010853 9101_ $$0I:(DE-588b)36225-6$$6P:(DE-82)IDM04026$$aRWTH Aachen$$b0$$kRWTH
001010853 9101_ $$0I:(DE-588b)36225-6$$6P:(DE-82)1011001$$aRWTH Aachen$$b1$$kRWTH
001010853 9201_ $$0I:(DE-82)611610_20140620$$k611610$$lLehrstuhl für Werkstoffe der Elektrotechnik II und Institut für Werkstoffe der Elektrotechnik$$x0
001010853 961__ $$c2025-05-05T10:49:31.607819$$x2025-05-05T10:49:31.607819$$z2025-05-06
001010853 9801_ $$aFullTexts
001010853 980__ $$aI:(DE-82)611610_20140620
001010853 980__ $$aUNRESTRICTED
001010853 980__ $$aVDB
001010853 980__ $$ajournal