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%0 Journal Article
%A Reclik, Tom
%A Medghalchi, Setareh
%A Schumacher, P.
%A Wollenweber, M. A.
%A Al-Samman, Talal
%A Korte-Kerzel, Sandra
%A Kerzel, Ulrich Bernd
%T Resolution enhancement of scanning electron micrographs using artificial intelligence
%J Materials and design
%V 253
%@ 1873-4197
%C Amsterdam [u.a.]
%I Elsevier Science
%M RWTH-2025-04907
%P 113955
%D 2025
%F PUB:(DE-HGF)16 ; PUB:(DE-HGF)7
%9 Journal ArticleContribution to a book
%U <Go to ISI:>//WOS:001478493100001
%R 10.1016/j.matdes.2025.113955
%U https://publications.rwth-aachen.de/record/1012191