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TY  - JOUR
AU  - Reclik, Tom
AU  - Medghalchi, Setareh
AU  - Schumacher, P.
AU  - Wollenweber, M. A.
AU  - Al-Samman, Talal
AU  - Korte-Kerzel, Sandra
AU  - Kerzel, Ulrich Bernd
TI  - Resolution enhancement of scanning electron micrographs using artificial intelligence
JO  - Materials and design
VL  - 253
SN  - 1873-4197
CY  - Amsterdam [u.a.]
PB  - Elsevier Science
M1  - RWTH-2025-04907
SP  - 113955
PY  - 2025
LB  - PUB:(DE-HGF)16 ; PUB:(DE-HGF)7
UR  - <Go to ISI:>//WOS:001478493100001
DO  - DOI:10.1016/j.matdes.2025.113955
UR  - https://publications.rwth-aachen.de/record/1012191
ER  -