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@ARTICLE{Reclik:1012191,
author = {Reclik, Tom and Medghalchi, Setareh and Schumacher, P. and
Wollenweber, M. A. and Al-Samman, Talal and Korte-Kerzel,
Sandra and Kerzel, Ulrich Bernd},
title = {{R}esolution enhancement of scanning electron micrographs
using artificial intelligence},
journal = {Materials and design},
volume = {253},
issn = {1873-4197},
address = {Amsterdam [u.a.]},
publisher = {Elsevier Science},
reportid = {RWTH-2025-04907},
pages = {113955},
year = {2025},
cin = {523110 / 520000},
ddc = {690},
cid = {$I:(DE-82)523110_20140620$ / $I:(DE-82)520000_20140620$},
pnm = {OAPKF - Open-Access-Publikation mit Unterstützung der RWTH
Aachen University (021000-OAPKF) / DFG project
G:(GEPRIS)278868966 - TRR 188: Schädigungskontrollierte
Umformprozesse (278868966) / DFG project G:(GEPRIS)498272503
- Anwendung von künstlicher Intelligenz im
Rasterelektronenmikroskop für beschleunigte hochauflösende
in-situ-Prüfung (T02#) (498272503) / DFG project
G:(GEPRIS)550760688 - Skalenüberbrückende
Charakterisierung von Schädigungsmechanismen, Mikrostruktur
und Materialeigenschaften (Project B02) (550760688)},
pid = {G:(DE-82)021000-OAPKF / G:(GEPRIS)278868966 /
G:(GEPRIS)498272503 / G:(GEPRIS)550760688},
typ = {PUB:(DE-HGF)16 / PUB:(DE-HGF)7},
UT = {WOS:001478493100001},
doi = {10.1016/j.matdes.2025.113955},
url = {https://publications.rwth-aachen.de/record/1012191},
}
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