%0 Journal Article %A Naghdali, Saeideh %A Schiester, Maximilian %A Waldl, Helene %A Terziyska, Velislava %A Hans, Marcus %A Primetzhofer, Daniel %A Schalk, Nina %A Tkadletz, Michael %T Improving the elemental and imaging accuracy in atom probe tomography of (Ti,Si)N single and multilayer coatings using isotopic substitution of N %J Ultramicroscopy %V 276 %@ 1879-2723 %C Amsterdam %I Elsevier Science %M RWTH-2025-05620 %P 114200 %D 2025 %Z Open access %F PUB:(DE-HGF)16 %9 Journal Article %R 10.1016/j.ultramic.2025.114200 %U https://publications.rwth-aachen.de/record/1013583