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100 | 1 | _ | |0 0000-0003-0914-4660 |a Naghdali, Saeideh |b 0 |e Corresponding author |
245 | _ | _ | |a Improving the elemental and imaging accuracy in atom probe tomography of (Ti,Si)N single and multilayer coatings using isotopic substitution of N |h online, print |
260 | _ | _ | |a Amsterdam |b Elsevier Science |c 2025 |
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700 | 1 | _ | |a Schiester, Maximilian |b 1 |
700 | 1 | _ | |a Waldl, Helene |b 2 |
700 | 1 | _ | |a Terziyska, Velislava |b 3 |
700 | 1 | _ | |0 P:(DE-82)IDM00995 |a Hans, Marcus |b 4 |u rwth |
700 | 1 | _ | |a Primetzhofer, Daniel |b 5 |
700 | 1 | _ | |a Schalk, Nina |b 6 |
700 | 1 | _ | |a Tkadletz, Michael |b 7 |
773 | _ | _ | |0 PERI:(DE-600)1479043-9 |a 10.1016/j.ultramic.2025.114200 |p 114200 |t Ultramicroscopy |v 276 |x 1879-2723 |y 2025 |
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