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TY  - JOUR
AU  - Lange, Felix
AU  - Zecherle, Markus
AU  - Grubert, Nicole
AU  - Stollenwerk, Jochen
AU  - Holly, Carlo
TI  - Throughput Analysis of Scan Devices for Laser Materials Processing
JO  - Lasers in manufacturing and materials processing
VL  - 12
IS  - 3
SN  - 2196-7237
CY  - New York, NY [u.a.]
PB  - Springer
M1  - RWTH-2025-05991
SP  - 649-677
PY  - 2025
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:001518484100001
DO  - DOI:10.1007/s40516-025-00302-y
UR  - https://publications.rwth-aachen.de/record/1014269
ER  -