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%0 Conference Paper
%A Santos Copetti, Thiago
%A Chakraborty, Supriya
%A Bolzani Poehls, Leticia M.
%T A Combined Strategy for Testing RRAMs After Manufacturing and During Lifetime
%C [Piscataway, NJ]
%I IEEE
%M RWTH-2025-06139
%P 6 Seiten
%D 2025
%< 2025 IEEE 26th Latin American Test Symposium (LATS) : 11-14 March 2025; conference location: San Andrés Islas, Colombia / publisher: IEEE ; [general co-chairs: Ernesto Sanchez – Politecnico di Torino, Italy; Yervant Zorian – Synopsys, USA ; publication co-chairs: Thiago S. Copetti – RWTH Aachen, Germany]
%B IEEE 26. Latin American Test Symposium
%C 11 Mar 2025 - 14 Mar 2025, San Andres Islas (Colombia)
Y2 11 Mar 2025 - 14 Mar 2025
M2 San Andres Islas, Colombia
%F PUB:(DE-HGF)7 ; PUB:(DE-HGF)8
%9 Contribution to a bookContribution to a conference proceedings
%U <Go to ISI:>//WOS:001480998600023
%R 10.1109/LATS65346.2025.10963957
%U https://publications.rwth-aachen.de/record/1014543