h1

001014543 001__ 1014543
001014543 005__ 20250715051736.0
001014543 0247_ $$2ISBN$$a978-1-6654-7763-5
001014543 0247_ $$2ISBN$$a978-1-6654-7764-2
001014543 0247_ $$2ISBN$$a978-1-66547-763-5
001014543 0247_ $$2ISBN$$a978-1-66547-764-2
001014543 0247_ $$2ISSN$$a2373-0862
001014543 0247_ $$2SCOPUS$$aSCOPUS:2-s2.0-105004731721
001014543 0247_ $$2WOS$$aWOS:001480998600023
001014543 0247_ $$2doi$$a10.1109/LATS65346.2025.10963957
001014543 037__ $$aRWTH-2025-06139
001014543 041__ $$aEnglish
001014543 1001_ $$0P:(DE-82)IDM04616$$aSantos Copetti, Thiago$$b0$$eCorresponding author$$urwth
001014543 1112_ $$aIEEE 26. Latin American Test Symposium$$cSan Andres Islas$$d2025-03-11 - 2025-03-14$$gLATS 2025$$wColombia
001014543 245__ $$aA Combined Strategy for Testing RRAMs After Manufacturing and During Lifetime$$honline, print
001014543 260__ $$a[Piscataway, NJ]$$bIEEE$$c2025
001014543 29510 $$a2025 IEEE 26th Latin American Test Symposium (LATS) : 11-14 March 2025; conference location: San Andrés Islas, Colombia / publisher: IEEE ; [general co-chairs: Ernesto Sanchez – Politecnico di Torino, Italy; Yervant Zorian – Synopsys, USA ; publication co-chairs: Thiago S. Copetti – RWTH Aachen, Germany]
001014543 300__ $$a6 Seiten
001014543 3367_ $$033$$2EndNote$$aConference Paper
001014543 3367_ $$0PUB:(DE-HGF)7$$2PUB:(DE-HGF)$$aContribution to a book
001014543 3367_ $$0PUB:(DE-HGF)8$$2PUB:(DE-HGF)$$aContribution to a conference proceedings$$bcontrib$$mcontrib
001014543 3367_ $$2BibTeX$$aINPROCEEDINGS
001014543 3367_ $$2DRIVER$$aconferenceObject
001014543 3367_ $$2DataCite$$aOutput Types/Conference Paper
001014543 3367_ $$2ORCID$$aCONFERENCE_PAPER
001014543 588__ $$aDataset connected to , , , CrossRef Conference
001014543 591__ $$aGermany
001014543 7001_ $$0P:(DE-82)1014558$$aChakraborty, Supriya$$b1$$urwth
001014543 7001_ $$aBolzani Poehls, Leticia M.$$b2$$eCorresponding author
001014543 909CO $$ooai:publications.rwth-aachen.de:1014543$$pVDB
001014543 9101_ $$0I:(DE-588b)36225-6$$6P:(DE-82)IDM04616$$aRWTH Aachen$$b0$$kRWTH
001014543 9101_ $$0I:(DE-588b)36225-6$$6P:(DE-82)1014558$$aRWTH Aachen$$b1$$kRWTH
001014543 9141_ $$y2025
001014543 9151_ $$0StatID:(DE-HGF)0041$$2StatID$$aPeer review status of article unknown$$x0
001014543 9201_ $$0I:(DE-82)611110_20170101$$k611110$$lLehrstuhl für Integrierte digitale Systeme und Schaltungsentwurf$$x0
001014543 961__ $$c2025-07-14T12:09:55.605488$$x2025-07-14T12:09:55.605488$$z2025-07-14T12:09:55.605488
001014543 980__ $$aI:(DE-82)611110_20170101
001014543 980__ $$aUNRESTRICTED
001014543 980__ $$aVDB
001014543 980__ $$acontb
001014543 980__ $$acontrib