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TY  - CONF
AU  - Santos Copetti, Thiago
AU  - Chakraborty, Supriya
AU  - Bolzani Poehls, Leticia M.
TI  - A Combined Strategy for Testing RRAMs After Manufacturing and During Lifetime
CY  - [Piscataway, NJ]
PB  - IEEE
M1  - RWTH-2025-06139
SP  - 6 Seiten
PY  - 2025
T2  - IEEE 26. Latin American Test Symposium
CY  - 11 Mar 2025 - 14 Mar 2025, San Andres Islas (Colombia)
Y2  - 11 Mar 2025 - 14 Mar 2025
M2  - San Andres Islas, Colombia
LB  - PUB:(DE-HGF)7 ; PUB:(DE-HGF)8
UR  - <Go to ISI:>//WOS:001480998600023
DO  - DOI:10.1109/LATS65346.2025.10963957
UR  - https://publications.rwth-aachen.de/record/1014543
ER  -