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| 001 | 1014543 | ||
| 005 | 20250715051736.0 | ||
| 024 | 7 | _ | |2 ISBN |a 978-1-6654-7763-5 |
| 024 | 7 | _ | |2 ISBN |a 978-1-6654-7764-2 |
| 024 | 7 | _ | |2 ISBN |a 978-1-66547-763-5 |
| 024 | 7 | _ | |2 ISBN |a 978-1-66547-764-2 |
| 024 | 7 | _ | |2 ISSN |a 2373-0862 |
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| 024 | 7 | _ | |2 WOS |a WOS:001480998600023 |
| 024 | 7 | _ | |2 doi |a 10.1109/LATS65346.2025.10963957 |
| 037 | _ | _ | |a RWTH-2025-06139 |
| 041 | _ | _ | |a English |
| 100 | 1 | _ | |0 P:(DE-82)IDM04616 |a Santos Copetti, Thiago |b 0 |e Corresponding author |u rwth |
| 111 | 2 | _ | |a IEEE 26. Latin American Test Symposium |c San Andres Islas |d 2025-03-11 - 2025-03-14 |g LATS 2025 |w Colombia |
| 245 | _ | _ | |a A Combined Strategy for Testing RRAMs After Manufacturing and During Lifetime |h online, print |
| 260 | _ | _ | |a [Piscataway, NJ] |b IEEE |c 2025 |
| 295 | 1 | 0 | |a 2025 IEEE 26th Latin American Test Symposium (LATS) : 11-14 March 2025; conference location: San Andrés Islas, Colombia / publisher: IEEE ; [general co-chairs: Ernesto Sanchez – Politecnico di Torino, Italy; Yervant Zorian – Synopsys, USA ; publication co-chairs: Thiago S. Copetti – RWTH Aachen, Germany] |
| 300 | _ | _ | |a 6 Seiten |
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| 591 | _ | _ | |a Germany |
| 700 | 1 | _ | |0 P:(DE-82)1014558 |a Chakraborty, Supriya |b 1 |u rwth |
| 700 | 1 | _ | |a Bolzani Poehls, Leticia M. |b 2 |e Corresponding author |
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| 914 | 1 | _ | |y 2025 |
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