%0 Journal Article %A Vonk, Vedran %A Tober, Steffen %A Leake, Steven J. %A Rabelo Coutinho Saraiva, Breno %A Randolph, Lisa %A Dangwal Pandey, Arti %A Keller, Thomas F. %A Steinrück, Hans-Georg %A Stierle, Andreas %T X-ray reflectivity from micrometre-scaled surfaces using nanobeams %J Journal of applied crystallography %V 58 %N 6 %@ 1600-5767 %C Copenhagen %I Munksgaard %M RWTH-2026-00248 %P 1978-1985 %D 2025 %F PUB:(DE-HGF)16 %9 Journal Article %U <Go to ISI:>//WOS:001632255400012 %R 10.1107/S1600576725008179 %U https://publications.rwth-aachen.de/record/1024685