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@ARTICLE{Vonk:1024685,
      author       = {Vonk, Vedran and Tober, Steffen and Leake, Steven J. and
                      Rabelo Coutinho Saraiva, Breno and Randolph, Lisa and
                      Dangwal Pandey, Arti and Keller, Thomas F. and Steinrück,
                      Hans-Georg and Stierle, Andreas},
      title        = {{X}-ray reflectivity from micrometre-scaled surfaces using
                      nanobeams},
      journal      = {Journal of applied crystallography},
      volume       = {58},
      number       = {6},
      issn         = {1600-5767},
      address      = {Copenhagen},
      publisher    = {Munksgaard},
      reportid     = {RWTH-2026-00248},
      pages        = {1978-1985},
      year         = {2025},
      cin          = {153005 / 150000},
      ddc          = {540},
      cid          = {$I:(DE-82)153005_20140620$ / $I:(DE-82)150000_20140620$},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:001632255400012},
      doi          = {10.1107/S1600576725008179},
      url          = {https://publications.rwth-aachen.de/record/1024685},
}