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%0 Conference Paper
%A Kopperberg, Nils
%A Noguera, Daniel Genua
%A Menzel, Stephan
%T 3D KMC Modelling of Doping Effects on the Reliability of Resistive Switching in VCM ReRAM Devices
%M RWTH-2026-01358
%D 2025
%B Memrisys 2025
%C 13 Oct 2025 - 16 Oct 2025, Edinburgh (UK)
Y2 13 Oct 2025 - 16 Oct 2025
M2 Edinburgh, UK
%F PUB:(DE-HGF)6
%9 Conference Presentation
%U https://publications.rwth-aachen.de/record/1027963