h1

h2

h3

h4

h5
h6
TY  - CONF
AU  - Kopperberg, Nils
AU  - Noguera, Daniel Genua
AU  - Menzel, Stephan
TI  - 3D KMC Modelling of Doping Effects on the Reliability of Resistive Switching in VCM ReRAM Devices
M1  - RWTH-2026-01358
PY  - 2025
T2  - Memrisys 2025
CY  - 13 Oct 2025 - 16 Oct 2025, Edinburgh (UK)
Y2  - 13 Oct 2025 - 16 Oct 2025
M2  - Edinburgh, UK
LB  - PUB:(DE-HGF)6
UR  - https://publications.rwth-aachen.de/record/1027963
ER  -