h1

h2

h3

h4

h5
h6
%0 Journal Article
%A Gasser, Fabian
%A John, Sanjay
%A Smets, Jorid
%A Simbrunner, Josef
%A Fratschko, Mario
%A Rubio-Giménez, Víctor
%A Ameloot, Rob
%A Steinrück, Hans-Georg
%A Resel, Roland
%T A systematic approach for quantitative orientation and phase fraction analysis of thin films through grazing-incidence X-ray diffraction
%J Journal of applied crystallography
%V 58
%N 4
%@ 0021-8898
%C Copenhagen
%I Munksgaard
%M RWTH-2026-01466
%P 1288-1298
%D 2025
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:001546346000017
%$ pmid:40765963
%R 10.1107/S1600576725004935
%U https://publications.rwth-aachen.de/record/1028115