Improved oxidation resistance of B-overstoichiometric Hf0.33-xAlxB0.67+y compared to Ti0.33-xAlxB0.67+y thin films: The role of point defects on grain boundary composition

Information
References
Discussion
Files

Improved oxidation resistance of B-overstoichiometric Hf0.33-xAlxB0.67+y compared to Ti0.33-xAlxB0.67+y thin films: The role of point defects on grain boundary composition - RWTH-2026-03689

Main document file(s):

Similar records

h1

h2

h3

h4

h5

h6

RWTH

Kontakt

RWTH Publications

Allgemeines