000137815 001__ 137815 000137815 005__ 20210927085149.0 000137815 0247_ $$2ISSN$$a0268-1242 000137815 0247_ $$2ISSN$$a1361-6641 000137815 0247_ $$2WOS$$aWOS:A1995RP66800010 000137815 0247_ $$2DOI$$a10.1088/0268-1242/10/8/010 000137815 0247_ $$2HSB$$aalm00035426x 000137815 0247_ $$2SCOPUS$$aSCOPUS:2-s2.0-0029357967 000137815 037__ $$aRWTH-CONV-018437 000137815 041__ $$aEnglish 000137815 1001_ $$0P:(DE-82)024529$$aWeber, T.$$b0$$eAuthor 000137815 245__ $$aFabry-Pérot oscillations in epitaxial ZnSe layers$$honline, print 000137815 260__ $$aBristol$$bIOP Publ.$$c1995 000137815 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal 000137815 3367_ $$2DataCite$$aOutput Types/Journal article 000137815 3367_ $$00$$2EndNote$$aJournal Article 000137815 3367_ $$2BibTeX$$aARTICLE 000137815 3367_ $$2ORCID$$aJOURNAL_ARTICLE 000137815 3367_ $$2DRIVER$$aarticle 000137815 591__ $$aGermany 000137815 7001_ $$0P:(DE-82)032336$$aStolz, H.$$b1$$eAuthor 000137815 7001_ $$0P:(DE-82)032337$$avon der Osten, W.$$b2$$eAuthor 000137815 7001_ $$0P:(DE-82)008435$$aHeuken, Michael$$b3$$eAuthor 000137815 7001_ $$0P:(DE-82)028804$$aHeime, Klaus$$b4$$eAuthor 000137815 773__ $$0PERI:(DE-600)1361285-2$$a10.1088/0268-1242/10/8/010$$n8$$p1113-1116$$tSemiconductor science and technology$$v10$$x0268-1242 000137815 909CO $$ooai:publications.rwth-aachen.de:137815$$pVDB 000137815 9151_ $$0StatID:(DE-HGF)0031$$2StatID$$aPeer reviewed article 000137815 9201_ $$0I:(DE-82)616110_20140620$$k616110$$lLehrstuhl für Halbleitertechnik I und Institut für Halbleitertechnik$$x0 000137815 961__ $$c2014-08-12$$x2007-07-26$$z2012-02-20 000137815 970__ $$aalm00035426x 000137815 980__ $$ajournal 000137815 980__ $$aI:(DE-82)616110_20140620 000137815 980__ $$aVDB 000137815 980__ $$aUNRESTRICTED 000137815 980__ $$aConvertedRecord