h1

h2

h3

h4

h5
h6
000137815 001__ 137815
000137815 005__ 20210927085149.0
000137815 0247_ $$2ISSN$$a0268-1242
000137815 0247_ $$2ISSN$$a1361-6641
000137815 0247_ $$2WOS$$aWOS:A1995RP66800010
000137815 0247_ $$2DOI$$a10.1088/0268-1242/10/8/010
000137815 0247_ $$2HSB$$aalm00035426x
000137815 0247_ $$2SCOPUS$$aSCOPUS:2-s2.0-0029357967
000137815 037__ $$aRWTH-CONV-018437
000137815 041__ $$aEnglish
000137815 1001_ $$0P:(DE-82)024529$$aWeber, T.$$b0$$eAuthor
000137815 245__ $$aFabry-Pérot oscillations in epitaxial ZnSe layers$$honline, print
000137815 260__ $$aBristol$$bIOP Publ.$$c1995
000137815 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal
000137815 3367_ $$2DataCite$$aOutput Types/Journal article
000137815 3367_ $$00$$2EndNote$$aJournal Article
000137815 3367_ $$2BibTeX$$aARTICLE
000137815 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000137815 3367_ $$2DRIVER$$aarticle
000137815 591__ $$aGermany
000137815 7001_ $$0P:(DE-82)032336$$aStolz, H.$$b1$$eAuthor
000137815 7001_ $$0P:(DE-82)032337$$avon der Osten, W.$$b2$$eAuthor
000137815 7001_ $$0P:(DE-82)008435$$aHeuken, Michael$$b3$$eAuthor
000137815 7001_ $$0P:(DE-82)028804$$aHeime, Klaus$$b4$$eAuthor
000137815 773__ $$0PERI:(DE-600)1361285-2$$a10.1088/0268-1242/10/8/010$$n8$$p1113-1116$$tSemiconductor science and technology$$v10$$x0268-1242
000137815 909CO $$ooai:publications.rwth-aachen.de:137815$$pVDB
000137815 9151_ $$0StatID:(DE-HGF)0031$$2StatID$$aPeer reviewed article
000137815 9201_ $$0I:(DE-82)616110_20140620$$k616110$$lLehrstuhl für Halbleitertechnik I und Institut für Halbleitertechnik$$x0
000137815 961__ $$c2014-08-12$$x2007-07-26$$z2012-02-20
000137815 970__ $$aalm00035426x
000137815 980__ $$ajournal
000137815 980__ $$aI:(DE-82)616110_20140620
000137815 980__ $$aVDB
000137815 980__ $$aUNRESTRICTED
000137815 980__ $$aConvertedRecord