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TY  - JOUR
AU  - Eickelkamp, Martin
AU  - Weingarten, Martin
AU  - Rahimzadeh Khoshroo, Lars
AU  - Ketteniß, Nico
AU  - Behmenburg, Hannes
AU  - Heuken, Michael
AU  - Donoval, D.
AU  - Chvála, A.
AU  - Kordos, Peter
AU  - Kalisch, Holger
AU  - Vescan, Andrei
TI  - Electrical Properties of Thermally Oxidized AlInN/AlN/GaN-based Metal Oxide Semiconductor Hetero Field Effect Transistors
JO  - Journal of applied physics
VL  - 110
IS  - 8
SN  - 0021-8979
CY  - Melville, NY
PB  - IOP Publ.
M1  - RWTH-CONV-026580
SP  - 084501
PY  - 2011
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000296519900146
DO  - DOI:10.1063/1.3647589
UR  - https://publications.rwth-aachen.de/record/147178
ER  -