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%0 Journal Article
%A Farahzadi, Azadeh
%A Beigmohamadi, Maryam
%A Niyamakom, Phenwisa
%A Kremers, Stephan
%A Meyer, Nico
%A Heuken, Michael
%A Wuttig, Matthias
%T Characterization of amorphous organic thin films, determination of precise model for spectroscopic ellipsometry measurements
%J Applied surface science
%V 107
%N 22
%@ 0169-4332
%C Amsterdam [u.a.]
%I Elsevier
%M RWTH-CONV-046447
%P 6612-6617
%D 2010
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000278908900021
%R 10.1016/j.apsusc.2010.04.057
%U https://publications.rwth-aachen.de/record/168810