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000168810 0247_ $$2DOI$$a10.1016/j.apsusc.2010.04.057
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000168810 041__ $$aEnglish
000168810 1001_ $$0P:(DE-82)000811$$aFarahzadi, Azadeh$$b0$$eAuthor
000168810 245__ $$aCharacterization of amorphous organic thin films, determination of precise model for spectroscopic ellipsometry measurements$$honline, print
000168810 260__ $$aAmsterdam [u.a.]$$bElsevier$$c2010
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000168810 7001_ $$0P:(DE-82)000809$$aBeigmohamadi, Maryam$$b1$$eAuthor
000168810 7001_ $$0P:(DE-82)010889$$aNiyamakom, Phenwisa$$b2$$eAuthor
000168810 7001_ $$0P:(DE-82)000812$$aKremers, Stephan$$b3$$eAuthor
000168810 7001_ $$0P:(DE-82)018035$$aMeyer, Nico$$b4$$eAuthor
000168810 7001_ $$0P:(DE-82)008435$$aHeuken, Michael$$b5$$eAuthor
000168810 7001_ $$0P:(DE-82)IDM00089$$aWuttig, Matthias$$b6$$eAuthor
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