TY - JOUR AU - Farahzadi, Azadeh AU - Beigmohamadi, Maryam AU - Niyamakom, Phenwisa AU - Kremers, Stephan AU - Meyer, Nico AU - Heuken, Michael AU - Wuttig, Matthias TI - Characterization of amorphous organic thin films, determination of precise model for spectroscopic ellipsometry measurements JO - Applied surface science VL - 107 IS - 22 SN - 0169-4332 CY - Amsterdam [u.a.] PB - Elsevier M1 - RWTH-CONV-046447 SP - 6612-6617 PY - 2010 LB - PUB:(DE-HGF)16 UR - <Go to ISI:>//WOS:000278908900021 DO - DOI:10.1016/j.apsusc.2010.04.057 UR - https://publications.rwth-aachen.de/record/168810 ER -