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TY  - JOUR
AU  - Farahzadi, Azadeh
AU  - Beigmohamadi, Maryam
AU  - Niyamakom, Phenwisa
AU  - Kremers, Stephan
AU  - Meyer, Nico
AU  - Heuken, Michael
AU  - Wuttig, Matthias
TI  - Characterization of amorphous organic thin films, determination of precise model for spectroscopic ellipsometry measurements
JO  - Applied surface science
VL  - 107
IS  - 22
SN  - 0169-4332
CY  - Amsterdam [u.a.]
PB  - Elsevier
M1  - RWTH-CONV-046447
SP  - 6612-6617
PY  - 2010
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000278908900021
DO  - DOI:10.1016/j.apsusc.2010.04.057
UR  - https://publications.rwth-aachen.de/record/168810
ER  -