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| 024 | 7 | _ | |2 ISSN |a 0169-4332 |
| 024 | 7 | _ | |2 WOS |a WOS:000278908900021 |
| 024 | 7 | _ | |2 DOI |a 10.1016/j.apsusc.2010.04.057 |
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| 037 | _ | _ | |a RWTH-CONV-046447 |
| 041 | _ | _ | |a English |
| 100 | 1 | _ | |0 P:(DE-82)000811 |a Farahzadi, Azadeh |b 0 |e Author |
| 245 | _ | _ | |a Characterization of amorphous organic thin films, determination of precise model for spectroscopic ellipsometry measurements |h online, print |
| 260 | _ | _ | |a Amsterdam [u.a.] |b Elsevier |c 2010 |
| 336 | 7 | _ | |0 PUB:(DE-HGF)16 |2 PUB:(DE-HGF) |a Journal Article |b journal |m journal |
| 336 | 7 | _ | |2 DataCite |a Output Types/Journal article |
| 336 | 7 | _ | |0 0 |2 EndNote |a Journal Article |
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| 591 | _ | _ | |a Germany |
| 700 | 1 | _ | |0 P:(DE-82)000809 |a Beigmohamadi, Maryam |b 1 |e Author |
| 700 | 1 | _ | |0 P:(DE-82)010889 |a Niyamakom, Phenwisa |b 2 |e Author |
| 700 | 1 | _ | |0 P:(DE-82)000812 |a Kremers, Stephan |b 3 |e Author |
| 700 | 1 | _ | |0 P:(DE-82)018035 |a Meyer, Nico |b 4 |e Author |
| 700 | 1 | _ | |0 P:(DE-82)008435 |a Heuken, Michael |b 5 |e Author |
| 700 | 1 | _ | |0 P:(DE-82)IDM00089 |a Wuttig, Matthias |b 6 |e Author |
| 773 | _ | _ | |0 PERI:(DE-600)2002520-8 |a 10.1016/j.apsusc.2010.04.057 |n 22 |p 6612-6617 |t Applied surface science |v 107 |x 0169-4332 |
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