h1

h2

h3

h4

h5
h6
%0 Journal Article
%A Balk, P.
%A Do Thanh, Liem
%A Ewert, S.
%A Kuball, M.
%A Schmitz, S.
%T Interface states and impurities in MOS structures with very thin tunneling barriers
%J Applied surface science
%V 30
%N 1/4
%@ 0169-4332
%C Amsterdam [u.a.]
%I Elsevier
%M RWTH-CONV-049753
%P 304-310
%D 1987
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:A1987K655900040
%R 10.1016/0169-4332(87)90105-X
%U https://publications.rwth-aachen.de/record/172293