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TY  - JOUR
AU  - Balk, P.
AU  - Do Thanh, Liem
AU  - Ewert, S.
AU  - Kuball, M.
AU  - Schmitz, S.
TI  - Interface states and impurities in MOS structures with very thin tunneling barriers
JO  - Applied surface science
VL  - 30
IS  - 1/4
SN  - 0169-4332
CY  - Amsterdam [u.a.]
PB  - Elsevier
M1  - RWTH-CONV-049753
SP  - 304-310
PY  - 1987
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:A1987K655900040
DO  - DOI:10.1016/0169-4332(87)90105-X
UR  - https://publications.rwth-aachen.de/record/172293
ER  -