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@ARTICLE{Balk:172293,
author = {Balk, P. and Do Thanh, Liem and Ewert, S. and Kuball, M.
and Schmitz, S.},
title = {{I}nterface states and impurities in {MOS} structures with
very thin tunneling barriers},
journal = {Applied surface science},
volume = {30},
number = {1/4},
issn = {0169-4332},
address = {Amsterdam [u.a.]},
publisher = {Elsevier},
reportid = {RWTH-CONV-049753},
pages = {304-310},
year = {1987},
cin = {131820 / 132110 / 616210 / ama216 / 130000},
cid = {$I:(DE-82)131820_20140620$ / $I:(DE-82)132110_20140620$ /
$I:(DE-82)616210_20140620$ / $I:(DE-82)ama216_20140620$ /
$I:(DE-82)130000_20140620$},
typ = {PUB:(DE-HGF)16},
UT = {WOS:A1987K655900040},
doi = {10.1016/0169-4332(87)90105-X},
url = {https://publications.rwth-aachen.de/record/172293},
}