guest ::
| 001 | 172293 | ||
| 005 | 20211116104734.0 | ||
| 024 | 7 | _ | |2 ISSN |a 0169-4332 |
| 024 | 7 | _ | |2 WOS |a WOS:A1987K655900040 |
| 024 | 7 | _ | |2 INSPEC |a 3063228 |
| 024 | 7 | _ | |2 DOI |a 10.1016/0169-4332(87)90105-X |
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| 024 | 7 | _ | |2 SCOPUS |a SCOPUS:2-s2.0-0023438909 |
| 037 | _ | _ | |a RWTH-CONV-049753 |
| 041 | _ | _ | |a English |
| 100 | 1 | _ | |0 P:(DE-82)108534 |a Balk, P. |b 0 |e Author |
| 245 | _ | _ | |a Interface states and impurities in MOS structures with very thin tunneling barriers |h online, print |
| 260 | _ | _ | |a Amsterdam [u.a.] |b Elsevier |c 1987 |
| 336 | 7 | _ | |0 PUB:(DE-HGF)16 |2 PUB:(DE-HGF) |a Journal Article |b journal |m journal |
| 336 | 7 | _ | |2 DataCite |a Output Types/Journal article |
| 336 | 7 | _ | |0 0 |2 EndNote |a Journal Article |
| 336 | 7 | _ | |2 BibTeX |a ARTICLE |
| 336 | 7 | _ | |2 ORCID |a JOURNAL_ARTICLE |
| 336 | 7 | _ | |2 DRIVER |a article |
| 591 | _ | _ | |a Germany |
| 700 | 1 | _ | |0 P:(DE-82)111095 |a Do Thanh, Liem |b 1 |e Author |
| 700 | 1 | _ | |0 P:(DE-82)109064 |a Ewert, S. |b 2 |e Author |
| 700 | 1 | _ | |0 P:(DE-82)111098 |a Kuball, M. |b 3 |e Author |
| 700 | 1 | _ | |0 P:(DE-82)031611 |a Schmitz, S. |b 4 |e Author |
| 773 | _ | _ | |0 PERI:(DE-600)2002520-8 |a 10.1016/0169-4332(87)90105-X |n 1/4 |p 304-310 |t Applied surface science |v 30 |x 0169-4332 |
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| 920 | 1 | _ | |0 I:(DE-82)616210_20140620 |k 616210 |l Lehrstuhl für Halbleitertechnik und Institut für Halbleitertechnik |x 2 |
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