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TY  - JOUR
AU  - Mackey, K. J.
AU  - Zahn, D. R. T.
AU  - Allen, P. M. G.
AU  - Williams, R. H.
AU  - Richter, Wolfgang
AU  - Williams, R. S.
TI  - InSb-CdTe interfaces: A combined study by soft X-ray photo emission, low energy electron diffraction and Raman spectroscopy
JO  - Journal of vacuum science & technology : JVST / B
VL  - 5
SN  - 0734-211x
CY  - New York, NY
PB  - American Institute of Physics
M1  - RWTH-CONV-051108
PY  - 1987
LB  - PUB:(DE-HGF)16
UR  - https://publications.rwth-aachen.de/record/173829
ER  -