TY - JOUR AU - Mackey, K. J. AU - Zahn, D. R. T. AU - Allen, P. M. G. AU - Williams, R. H. AU - Richter, Wolfgang AU - Williams, R. S. TI - InSb-CdTe interfaces: A combined study by soft X-ray photo emission, low energy electron diffraction and Raman spectroscopy JO - Journal of vacuum science & technology : JVST / B VL - 5 SN - 0734-211x CY - New York, NY PB - American Institute of Physics M1 - RWTH-CONV-051108 PY - 1987 LB - PUB:(DE-HGF)16 UR - https://publications.rwth-aachen.de/record/173829 ER -