%0 Journal Article %A Eden, K. %A Beneking, H. %A Roth, W. %A Krings, A.-M. %T Influence of DUV excimer laser radiation ( = 193nm) on CMOS devices %J Applied surface science %V 36 %@ 0169-4332 %C Amsterdam [u.a.] %I Elsevier %M RWTH-CONV-051567 %P 421-431 %D 1989 %F PUB:(DE-HGF)16 %9 Journal Article %U https://publications.rwth-aachen.de/record/174323