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@ARTICLE{Feldkamp:188179,
author = {Feldkamp, J. M. and Schroer, C. G. and Patommel, J. and
Lengeler, Bruno and Günzler, T. F. and Schweitzer, M. and
Stenzel, C. and Dieckmann, M. and Schroeder, W. H.},
title = {{C}ompact x-ray microtomography system for element mapping
and absorption imaging},
journal = {Review of scientific instruments : RSI},
volume = {78},
number = {7},
issn = {0034-6748},
address = {Melville, NY},
publisher = {AIP},
reportid = {RWTH-CONV-064524},
pages = {073702},
year = {2007},
cin = {132310 / hsbk010098 / 130000},
cid = {$I:(DE-82)132310_20140620$ / $I:(DE-82)hsbk010098_20140620$
/ $I:(DE-82)130000_20140620$},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000248486300031},
doi = {10.1063/1.2751094},
url = {https://publications.rwth-aachen.de/record/188179},
}