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%0 Thesis %A Ram, Farangis %T The Kikuchi bandlet method for the intensity analysis of the electron backscatter Kikuchi diffraction patterns %I Aachen, Techn. Hochsch. %V Dissertation %C Aachen %M RWTH-2015-01069 %P XIV, 167 S. : Ill., graph. Darst. %D 2015 %Z Aachen, Techn. Hochsch., Diss., 2015 %X The present dissertation attempts to extend the application fields of the Electron Backscatter Kikuchi Diffraction technique (EBSD) by enabling the analysis of the intensity of the Electron Backscatter Kikuchi Diffraction patterns (EBSPs). It also presents an error analysis for the conventional method that retrieves the crystallographic orientation from an EBSP. The error analysis is performed on simulated patterns. An analytical, inferential statistics-based method for estimating the accuracy of a retrieved orientation and a retrieved misorientation of a real pattern is validated. The second part of this work introduces a method, which deconvolutes and reconstructs the individual Kikuchi bands, and thus, enables an accurate and automatic analysis of their intensity profiles. The method is termed the Kikuchi bandlet method. Two of this method's exemplary applications are also presented: (1) the quantification of the stored crystalline defects and (2) the improvement of the accuracy of the retrieved crystal orientation and the retrieved projection parameters of an EBSP. The method proposed for quantifying the stored defects through quantifying the individual Kikuchi band's sharpness is applied to a controlled experimental case of bending a micro-cantilever. It is shown that, using this method, for each reflector, the deviation of the atomic positions from equilibrium can be retrieved through the band sharpness, which, in effect, measures the incoherency of the diffracted beams. Linking the band sharpness to the underlying crystal structure is performed through the simulation of Kikuchi patterns resulting from a crystal structure containing a known defect, and subsequently, analysing the pattern with the Kikuchi bandlet method. The results shows that the dislocation is clearly visible on the planes that fulfil the →g<sub>hkl</sub> ·→b = 0 criterion of diffraction, with →b being the dislocation's Burgers vector and →g<sub>hkl</sub> being the reciprocal space vector of the reflector. They also show that the retrieved band sharpness correlates with the →g<sub>hkl</sub> ·→b value.The intensity profile analysis of a reconstructed K-band reveals its characteristic hyperbolic features. Using these curves increases the accuracy of the estimated orientation and projection center. This is presented as the second application of the Kikuchi bandlet method. In the case studied here, for simulated pattern, an order of magnitude improvement in orientation accuracy and 5 times improvement in projection center accuracy is achieved. %F PUB:(DE-HGF)11 %9 Dissertation / PhD Thesis %U https://publications.rwth-aachen.de/record/463845