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@PHDTHESIS{Ram:463845,
author = {Ram, Farangis},
othercontributors = {Zaefferer, Stefan and Mayer, Joachim and Winkelmann, Aimo},
title = {{T}he {K}ikuchi bandlet method for the intensity analysis
of the electron backscatter {K}ikuchi diffraction patterns},
school = {Aachen, Techn. Hochsch.},
type = {Dissertation},
address = {Aachen},
publisher = {Publikationsserver der RWTH Aachen University},
reportid = {RWTH-2015-01069},
pages = {XIV, 167 S. : Ill., graph. Darst.},
year = {2015},
note = {Aachen, Techn. Hochsch., Diss., 2015},
abstract = {The present dissertation attempts to extend the application
fields of the Electron Backscatter Kikuchi Diffraction
technique (EBSD) by enabling the analysis of the intensity
of the Electron Backscatter Kikuchi Diffraction patterns
(EBSPs). It also presents an error analysis for the
conventional method that retrieves the crystallographic
orientation from an EBSP. The error analysis is performed on
simulated patterns. An analytical, inferential
statistics-based method for estimating the accuracy of a
retrieved orientation and a retrieved misorientation of a
real pattern is validated. The second part of this work
introduces a method, which deconvolutes and reconstructs the
individual Kikuchi bands, and thus, enables an accurate and
automatic analysis of their intensity profiles. The method
is termed the Kikuchi bandlet method. Two of this method's
exemplary applications are also presented: (1) the
quantification of the stored crystalline defects and (2) the
improvement of the accuracy of the retrieved crystal
orientation and the retrieved projection parameters of an
EBSP. The method proposed for quantifying the stored defects
through quantifying the individual Kikuchi band's sharpness
is applied to a controlled experimental case of bending a
micro-cantilever. It is shown that, using this method, for
each reflector, the deviation of the atomic positions from
equilibrium can be retrieved through the band sharpness,
which, in effect, measures the incoherency of the diffracted
beams. Linking the band sharpness to the underlying crystal
structure is performed through the simulation of Kikuchi
patterns resulting from a crystal structure containing a
known defect, and subsequently, analysing the pattern with
the Kikuchi bandlet method. The results shows that the
dislocation is clearly visible on the planes that fulfil the
$\vec g_{hkl} \cdot \vec b = 0$ criterion of diffraction,
with $\vec b$ being the dislocation's Burgers vector and
$\vec g_{hkl}$ being the reciprocal space vector of the
reflector. They also show that the retrieved band sharpness
correlates with the $\vec g_{hkl} \cdot \vec b$ value.The
intensity profile analysis of a reconstructed K-band reveals
its characteristic hyperbolic features. Using these curves
increases the accuracy of the estimated orientation and
projection center. This is presented as the second
application of the Kikuchi bandlet method. In the case
studied here, for simulated pattern, an order of magnitude
improvement in orientation accuracy and $5$ times
improvement in projection center accuracy is achieved.},
cin = {523110 / 520000},
ddc = {620},
cid = {$I:(DE-82)523110_20140620$ / $I:(DE-82)520000_20140620$},
typ = {PUB:(DE-HGF)11},
urn = {urn:nbn:de:hbz:82-rwth-2015-010692},
url = {https://publications.rwth-aachen.de/record/463845},
}
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