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@PHDTHESIS{Niyamakom:50571,
author = {Niyamakom, Phenwisa},
othercontributors = {Wuttig, Matthias},
title = {{I}nfluence of deposition parameters on morphology, growth
and structure of crystalline and amorphous organic thin
films : (the case of perylene and alpha-{NPD})},
address = {Aachen},
publisher = {Publikationsserver der RWTH Aachen University},
reportid = {RWTH-CONV-113111},
pages = {IV, 161 S. : Ill., graph. Darst.},
year = {2008},
note = {Zsfassung in dt. und engl. Sprache; Aachen, Techn.
Hochsch., Diss., 2008},
abstract = {A growing research effort in organic electronics has been
developped rapidly to utilize the electronic and optical
properties of organic materials (polymers and oligomers) and
hybrids (organic-inorganic composites) through novel
material synthesis, thin film deposition techniques and many
mores. Several applications, e.g. organic thin film
transistors (OTFTs) and organic light emitting devices
(OLEDs), have been envisioned in both academic research and
industry. An understanding of thin film growth is crucial to
tailor surface morphologies and organic film properties
suitable for specific applications. In OTFTs, the highest
possible electron mobilities are desired. Typically, the
conductivity in crystalline organic materials is anisotropic
and strongly depends upon the electronic coupling between
the neighboring molecules in the different crystallographic
directions. Therefore, highly textured crystalline organic
thin films are required for electronic applications. In
OLEDs, the absence of long-range order in amorphous films
can result in smooth surfaces and effcient radiative
recombination, which allows for the realization of high
performance organic optoelectronic devices. Amorphous
organic thin film hence are preferable in this case. In this
dissertation, the growth, morphology and structure of
organic thin films both of crystalline and amorphous films
has been investigated. For the crystalline organic thin film
growth in the case of perylene, we focus on two different
topics, i.e. temperature dependence of dislocation formation
in perylene films and the temperature dependence of perylene
thin film growth on gold substrate. The temperature
dependence of dislocation formation in perylene films has
been studied to obtain a better understanding of
dislocation-assisted growth in perylene films upon changing
substrate temperatures. The surface morphology and
structural properties have been studied by atomic force
microscopy (AFM) and X-ray diffractometry (XRD).
Subsequently, for the study of the temperature dependence of
perylene thin film growth on gold substrates, molecular
vibrations in the perylene films are studied and related to
structural properties, including surface morphology, as
investigated by Fourier transform infrared spectroscopy
(FT-IR), XRD and AFM, respectively. In a subsequent chapter
for the amorphous organic thin film growth in the case of
a-NPD, two different deposition techniques, Organic Vapor
Phase Deposition (OVPD) and Vacuum Thermal Evaporation
(VTE), were chosen. A study of the influence of deposition
parameters, on film properties has been performed.
Subsequently, AFM and X-ray reflectometry (XRR) have been
employed to investigate film morphology and structural
properties.},
keywords = {Organischer Kristall (SWD) / Amorpher Festkörper (SWD) /
Perylen (SWD) / Organischer Halbleiter (SWD)},
cin = {131110 / 130000},
ddc = {530},
cid = {$I:(DE-82)131110_20140620$ / $I:(DE-82)130000_20140620$},
typ = {PUB:(DE-HGF)11},
urn = {urn:nbn:de:hbz:82-opus-26713},
url = {https://publications.rwth-aachen.de/record/50571},
}
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