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@ARTICLE{Xu:565085,
      author       = {Xu, Ming and Yu, Zhenhai and Wang, Lin and Mazzarello,
                      Riccardo and Wuttig, Matthias},
      title        = {{R}eversing the {R}esistivity {C}ontrast in the
                      {P}hase-{C}hange {M}emory {M}aterial {G}e{S}b 2 {T}e 4
                      {U}sing {H}igh {P}ressure},
      journal      = {Advanced Electronic Materials},
      volume       = {1},
      number       = {12},
      issn         = {2199-160X},
      address      = {Chichester},
      publisher    = {Wiley},
      reportid     = {RWTH-2015-07581},
      year         = {2015},
      cin          = {135130 / 080012 / 080009 / 131110 / 130000 / 135510 /
                      135420},
      ddc          = {621.3},
      cid          = {$I:(DE-82)135130_20140620$ / $I:(DE-82)080012_20140620$ /
                      $I:(DE-82)080009_20140620$ / $I:(DE-82)131110_20140620$ /
                      $I:(DE-82)130000_20140620$ / $I:(DE-82)135510_20140620$ /
                      $I:(DE-82)135420_20140620$},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000368916500011},
      doi          = {10.1002/aelm.201500240},
      url          = {https://publications.rwth-aachen.de/record/565085},
}