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@ARTICLE{Rtten:567213,
      author       = {Rütten, Martin and Kaes, Matthias and Albert, Andreas and
                      Wuttig, Matthias and Salinga, Martin},
      title        = {{R}elation between bandgap and resistance drift in
                      amorphous phase change materials},
      journal      = {Scientific reports},
      volume       = {5},
      issn         = {2045-2322},
      address      = {London},
      publisher    = {Nature Publishing Group},
      reportid     = {RWTH-2016-00700},
      pages        = {17362},
      year         = {2015},
      cin          = {131110 / 130000},
      ddc          = {000},
      cid          = {$I:(DE-82)131110_20140620$ / $I:(DE-82)130000_20140620$},
      pnm          = {Resistiv schaltende Chalkogenide für zukünftige
                      Elektronikanwendungen: Strukturen, Kinetik und
                      Bauelementskalierung $\u201eNanoswitches\u201c$
                      (RESIST-SCHALT-20170406)},
      pid          = {G:(GEPRIS)167917811},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000365480900001},
      pubmed       = {pmid:26621533},
      doi          = {10.1038/srep17362},
      url          = {https://publications.rwth-aachen.de/record/567213},
}