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@ARTICLE{Zhang:658534,
      author       = {Zhang, Bin and Zhang, Wei and Shen, Zhenju and Chen,
                      Yongjin and Li, Jixue and Zhang, Shengbai and Zhang, Ze and
                      Wuttig, Matthias and Mazzarello, Riccardo and Ma, Evan and
                      Han, Xiaodong},
      title        = {{E}lement-resolved atomic structure imaging of rocksalt
                      {G}e2{S}b2{T}e5 phase-change material},
      journal      = {Applied physics letters},
      volume       = {108},
      number       = {19},
      issn         = {1077-3118},
      address      = {Melville, NY},
      publisher    = {American Inst. of Physics},
      reportid     = {RWTH-2016-04280},
      pages        = {191902},
      year         = {2016},
      cin          = {130000 / 080012 / 080009 / 131110 / 135130 / 135510 /
                      135420},
      ddc          = {530},
      cid          = {$I:(DE-82)130000_20140620$ / $I:(DE-82)080012_20140620$ /
                      $I:(DE-82)080009_20140620$ / $I:(DE-82)131110_20140620$ /
                      $I:(DE-82)135130_20140620$ / $I:(DE-82)135510_20140620$ /
                      $I:(DE-82)135420_20140620$},
      pnm          = {Resistiv schaltende Chalkogenide für zukünftige
                      Elektronikanwendungen: Strukturen, Kinetik und
                      Bauelementskalierung $\u201eNanoswitches\u201c$
                      (RESIST-SCHALT-20170406)},
      pid          = {G:(GEPRIS)167917811},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000377023500022},
      doi          = {10.1063/1.4949011},
      url          = {https://publications.rwth-aachen.de/record/658534},
}