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000792149 1001_ $$0P:(DE-82)IDM03422$$aWalch, Emmanuel$$b0$$eCorresponding author$$urwth
000792149 245__ $$aSimultaneous measurement of coefficient of thermal expansion and biaxial modulus of enamel thick films deposited on glass substrates by curvature technique$$honline
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000792149 7001_ $$aBenedetto, Alessandro$$b1
000792149 7001_ $$aBacharouche, Jalal$$b2
000792149 7001_ $$0P:(DE-82)IDM01506$$aRoos, Christian Hans-Georg$$b3$$urwth
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