h1

000804410 001__ 804410
000804410 005__ 20230320140152.0
000804410 0247_ $$2ISSN$$a0022-2461
000804410 0247_ $$2ISSN$$a1573-4803
000804410 0247_ $$2SCOPUS$$aSCOPUS:2-s2.0-85091506255
000804410 0247_ $$2WOS$$aWOS:000572707700002
000804410 0247_ $$2doi$$a10.1007/s10853-020-05337-4
000804410 037__ $$aRWTH-2020-10255
000804410 041__ $$aEnglish
000804410 082__ $$a670
000804410 1001_ $$00000-0001-8839-1154$$aWalter, P.$$b0$$eCorresponding author
000804410 245__ $$aIn situ X-ray measurements over large Q-space to study the evolution of oxide thin films prepared by RF sputter deposition$$honline
000804410 260__ $$aDordrecht [u.a.]$$bSpringer Science + Business Media B.V$$c2021
000804410 260__ $$c2020
000804410 3367_ $$00$$2EndNote$$aJournal Article
000804410 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal
000804410 3367_ $$2BibTeX$$aARTICLE
000804410 3367_ $$2DRIVER$$aarticle
000804410 3367_ $$2DataCite$$aOutput Types/Journal article
000804410 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000804410 500__ $$aPublished: 25 September 2020
000804410 588__ $$aDataset connected to CrossRef
000804410 591__ $$aFrance
000804410 591__ $$aGermany
000804410 591__ $$aUSA
000804410 7001_ $$aWernecke, J.$$b1
000804410 7001_ $$aScholz, M.$$b2
000804410 7001_ $$aReuther, D.$$b3
000804410 7001_ $$aRothkirch, A.$$b4
000804410 7001_ $$aHaas, D.$$b5
000804410 7001_ $$aBlume, J.$$b6
000804410 7001_ $$aResta, A.$$b7
000804410 7001_ $$aVlad, A.$$b8
000804410 7001_ $$0P:(DE-82)040216$$aFaley, Olga$$b9$$urwth
000804410 7001_ $$0P:(DE-82)009001$$aSchipmann, Susanne$$b10$$urwth
000804410 7001_ $$0P:(DE-82)710294$$aNent, Alexander$$b11$$urwth
000804410 7001_ $$aSeeck, O.$$b12
000804410 7001_ $$aDippel, A.-C.$$b13
000804410 7001_ $$0P:(DE-82)IDM00076$$aKlemradt, Uwe$$b14$$urwth
000804410 773__ $$0PERI:(DE-600)2015305-3$$a10.1007/s10853-020-05337-4$$p290-304$$tJournal of materials science$$v56$$x1573-4803$$y2021
000804410 909CO $$ooai:publications.rwth-aachen.de:804410$$pVDB
000804410 9101_ $$0I:(DE-588b)36225-6$$6P:(DE-82)040216$$aRWTH Aachen$$b9$$kRWTH
000804410 9101_ $$0I:(DE-588b)36225-6$$6P:(DE-82)009001$$aRWTH Aachen$$b10$$kRWTH
000804410 9101_ $$0I:(DE-588b)36225-6$$6P:(DE-82)710294$$aRWTH Aachen$$b11$$kRWTH
000804410 9101_ $$0I:(DE-588b)36225-6$$6P:(DE-82)IDM00076$$aRWTH Aachen$$b14$$kRWTH
000804410 9141_ $$y2020
000804410 9151_ $$0StatID:(DE-HGF)0031$$2StatID$$aPeer reviewed article$$x0
000804410 915__ $$0StatID:(DE-HGF)0030$$2StatID$$aPeer Review$$bASC$$d2020-01-16
000804410 915__ $$0StatID:(DE-HGF)0100$$2StatID$$aJCR$$bJ MATER SCI : 2018$$d2020-01-16
000804410 915__ $$0StatID:(DE-HGF)0110$$2StatID$$aWoS$$bScience Citation Index$$d2020-01-16
000804410 915__ $$0StatID:(DE-HGF)0111$$2StatID$$aWoS$$bScience Citation Index Expanded$$d2020-01-16
000804410 915__ $$0StatID:(DE-HGF)0113$$2StatID$$aWoS$$bScience Citation Index Expanded$$d2020-09-02
000804410 915__ $$0StatID:(DE-HGF)0150$$2StatID$$aDBCoverage$$bWeb of Science Core Collection$$d2020-01-16
000804410 915__ $$0StatID:(DE-HGF)0160$$2StatID$$aDBCoverage$$bEssential Science Indicators$$d2020-01-16
000804410 915__ $$0StatID:(DE-HGF)0199$$2StatID$$aDBCoverage$$bClarivate Analytics Master Journal List$$d2020-01-16
000804410 915__ $$0StatID:(DE-HGF)0200$$2StatID$$aDBCoverage$$bSCOPUS$$d2020-01-16
000804410 915__ $$0StatID:(DE-HGF)0300$$2StatID$$aDBCoverage$$bMedline$$d2020-01-16
000804410 915__ $$0StatID:(DE-HGF)0420$$2StatID$$aNationallizenz$$d2020-01-16$$wger
000804410 915__ $$0StatID:(DE-HGF)0420$$2StatID$$aNationallizenz$$d2020-09-02$$wger
000804410 915__ $$0StatID:(DE-HGF)0600$$2StatID$$aDBCoverage$$bEbsco Academic Search$$d2020-01-16
000804410 915__ $$0StatID:(DE-HGF)1150$$2StatID$$aDBCoverage$$bCurrent Contents - Physical, Chemical and Earth Sciences$$d2020-01-16
000804410 915__ $$0StatID:(DE-HGF)1160$$2StatID$$aDBCoverage$$bCurrent Contents - Engineering, Computing and Technology$$d2020-01-16
000804410 915__ $$0StatID:(DE-HGF)1230$$2StatID$$aDBCoverage$$bCurrent Contents - Electronics and Telecommunications Collection$$d2020-01-16
000804410 915__ $$0StatID:(DE-HGF)3002$$2StatID$$aDEAL Springer$$d2020-01-16$$wger
000804410 915__ $$0StatID:(DE-HGF)3002$$2StatID$$aDEAL Springer$$d2020-09-02$$wger
000804410 915__ $$0StatID:(DE-HGF)9900$$2StatID$$aIF < 5$$d2020-01-16
000804410 915__ $$0StatID:(DE-HGF)9900$$2StatID$$aIF < 5$$d2020-09-02
000804410 9201_ $$0I:(DE-82)132520_20140620$$k132520$$lLehr- und Forschungsgebiet Experimentelle Physik der kondensierten Materie$$x0
000804410 9201_ $$0I:(DE-82)130000_20140620$$k130000$$lFachgruppe Physik$$x1
000804410 9201_ $$0I:(DE-82)080044_20160218$$k080044$$lJARA-Institut FIT Green IT$$x2
000804410 961__ $$c2020-10-20T12:23:37.029807$$x2020-10-20T12:23:37.029807$$z2020-10-20
000804410 980__ $$aI:(DE-82)080044_20160218
000804410 980__ $$aI:(DE-82)130000_20140620
000804410 980__ $$aI:(DE-82)132520_20140620
000804410 980__ $$aUNRESTRICTED
000804410 980__ $$aVDB
000804410 980__ $$ajournal