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@ARTICLE{Walter:804410,
author = {Walter, P. and Wernecke, J. and Scholz, M. and Reuther, D.
and Rothkirch, A. and Haas, D. and Blume, J. and Resta, A.
and Vlad, A. and Faley, Olga and Schipmann, Susanne and
Nent, Alexander and Seeck, O. and Dippel, A.-C. and
Klemradt, Uwe},
title = {{I}n situ {X}-ray measurements over large {Q}-space to
study the evolution of oxide thin films prepared by {RF}
sputter deposition},
journal = {Journal of materials science},
volume = {56},
issn = {1573-4803},
address = {Dordrecht [u.a.]},
publisher = {Springer Science + Business Media B.V},
reportid = {RWTH-2020-10255},
pages = {290-304},
year = {2021},
note = {Published: 25 September 2020},
cin = {132520 / 130000 / 080044},
ddc = {670},
cid = {$I:(DE-82)132520_20140620$ / $I:(DE-82)130000_20140620$ /
$I:(DE-82)080044_20160218$},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000572707700002},
doi = {10.1007/s10853-020-05337-4},
url = {https://publications.rwth-aachen.de/record/804410},
}