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%0 Journal Article
%A Poehls, Leticia Maria Bolzani
%A Fieback, M. C. R.
%A Hoffmann-Eifert, S.
%A Santos Copetti, T.
%A Brum, E.
%A Menzel, Stephan
%A Hamdioui, S.
%A Gemmeke, Tobias
%T Review of Manufacturing Process Defects and Their Effects on Memristive Devices
%J Journal of electronic testing
%V 37
%N 4
%@ 1573-0727
%C Dordrecht [u.a.]
%I Springer Science + Business Media B.V
%M RWTH-2021-10244
%P 427-437
%D 2021
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000709238700001
%R 10.1007/s10836-021-05968-8
%U https://publications.rwth-aachen.de/record/835039