h1

000835039 001__ 835039
000835039 005__ 20220302103945.0
000835039 0247_ $$2ISSN$$a0923-8174
000835039 0247_ $$2ISSN$$a1573-0727
000835039 0247_ $$2SCOPUS$$aSCOPUS:2-s2.0-85117403194
000835039 0247_ $$2WOS$$aWOS:000709238700001
000835039 0247_ $$2datacite_doi$$a10.18154/RWTH-2021-10244
000835039 0247_ $$2doi$$a10.1007/s10836-021-05968-8
000835039 037__ $$aRWTH-2021-10244
000835039 041__ $$aEnglish
000835039 082__ $$a670
000835039 1001_ $$0P:(DE-82)820257$$aPoehls, Leticia Maria Bolzani$$b0$$eCorresponding author$$urwth
000835039 245__ $$aReview of Manufacturing Process Defects and Their Effects on Memristive Devices$$honline, print
000835039 260__ $$aDordrecht [u.a.]$$bSpringer Science + Business Media B.V$$c2021
000835039 3367_ $$00$$2EndNote$$aJournal Article
000835039 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$xReview Article
000835039 3367_ $$2BibTeX$$aARTICLE
000835039 3367_ $$2DRIVER$$aarticle
000835039 3367_ $$2DataCite$$aOutput Types/Journal article
000835039 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000835039 588__ $$aDataset connected to Web of Science, Web of Science, , CrossRef, Journals: publications.rwth-aachen.de
000835039 591__ $$aBrazil
000835039 591__ $$aGermany
000835039 591__ $$aNetherlands
000835039 7001_ $$aFieback, M. C. R.$$b1
000835039 7001_ $$0P:(DE-82)016267$$aHoffmann-Eifert, S.$$b2$$urwth
000835039 7001_ $$0P:(DE-82)IDM04616$$aSantos Copetti, T.$$b3$$urwth
000835039 7001_ $$aBrum, E.$$b4
000835039 7001_ $$0P:(DE-588)1171365098$$aMenzel, Stephan$$b5$$urwth
000835039 7001_ $$aHamdioui, S.$$b6
000835039 7001_ $$0P:(DE-82)IDM01616$$aGemmeke, Tobias$$b7$$urwth
000835039 773__ $$0PERI:(DE-600)1479776-8$$a10.1007/s10836-021-05968-8$$n4$$p427-437$$tJournal of electronic testing$$v37$$x1573-0727$$y2021
000835039 8564_ $$uhttps://publications.rwth-aachen.de/record/835039/files/835039.pdf$$yOpenAccess
000835039 909CO $$ooai:publications.rwth-aachen.de:835039$$pVDB$$pdnbdelivery$$pdriver$$popen_access$$popenaire
000835039 9101_ $$0I:(DE-588b)36225-6$$6P:(DE-82)820257$$aRWTH Aachen$$b0$$kRWTH
000835039 9101_ $$0I:(DE-588b)36225-6$$6P:(DE-82)016267$$aRWTH Aachen$$b2$$kRWTH
000835039 9101_ $$0I:(DE-588b)36225-6$$6P:(DE-82)IDM04616$$aRWTH Aachen$$b3$$kRWTH
000835039 9101_ $$0I:(DE-588b)36225-6$$6P:(DE-588)1171365098$$aRWTH Aachen$$b5$$kRWTH
000835039 9101_ $$0I:(DE-588b)36225-6$$6P:(DE-82)IDM01616$$aRWTH Aachen$$b7$$kRWTH
000835039 9141_ $$y2021
000835039 9151_ $$0StatID:(DE-HGF)0031$$2StatID$$aPeer reviewed article$$x0
000835039 915__ $$0LIC:(DE-HGF)CCBY4$$2HGFVOC$$aCreative Commons Attribution CC BY 4.0
000835039 915__ $$0StatID:(DE-HGF)0030$$2StatID$$aPeer Review$$bASC$$d2021-01-27
000835039 915__ $$0StatID:(DE-HGF)0100$$2StatID$$aJCR$$bJ ELECTRON TEST : 2019$$d2021-01-27
000835039 915__ $$0StatID:(DE-HGF)0113$$2StatID$$aWoS$$bScience Citation Index Expanded$$d2021-01-27
000835039 915__ $$0StatID:(DE-HGF)0150$$2StatID$$aDBCoverage$$bWeb of Science Core Collection$$d2021-01-27
000835039 915__ $$0StatID:(DE-HGF)0160$$2StatID$$aDBCoverage$$bEssential Science Indicators$$d2021-01-27
000835039 915__ $$0StatID:(DE-HGF)0199$$2StatID$$aDBCoverage$$bClarivate Analytics Master Journal List$$d2021-01-27
000835039 915__ $$0StatID:(DE-HGF)0200$$2StatID$$aDBCoverage$$bSCOPUS$$d2021-01-27
000835039 915__ $$0StatID:(DE-HGF)0420$$2StatID$$aNationallizenz$$d2021-01-27$$wger
000835039 915__ $$0StatID:(DE-HGF)0510$$2StatID$$aOpenAccess
000835039 915__ $$0StatID:(DE-HGF)0600$$2StatID$$aDBCoverage$$bEbsco Academic Search$$d2021-01-27
000835039 915__ $$0StatID:(DE-HGF)1160$$2StatID$$aDBCoverage$$bCurrent Contents - Engineering, Computing and Technology$$d2021-01-27
000835039 915__ $$0StatID:(DE-HGF)1230$$2StatID$$aDBCoverage$$bCurrent Contents - Electronics and Telecommunications Collection$$d2021-01-27
000835039 915__ $$0StatID:(DE-HGF)3002$$2StatID$$aDEAL Springer$$d2021-01-27$$wger
000835039 915__ $$0StatID:(DE-HGF)9900$$2StatID$$aIF < 5$$d2021-01-27
000835039 9201_ $$0I:(DE-82)611610_20140620$$k611610$$lLehrstuhl für Werkstoffe der Elektrotechnik II und Institut für Werkstoffe der Elektrotechnik$$x0
000835039 9201_ $$0I:(DE-82)611110_20170101$$k611110$$lLehrstuhl für Integrierte digitale Systeme und Schaltungsentwurf$$x1
000835039 9201_ $$0I:(DE-82)080009_20140620$$k080009$$lJARA-FIT$$x2
000835039 961__ $$c2021-11-08T08:30:09.301834$$x2021-11-08T08:30:09.301834$$z2021-11-08T08:30:09.301834
000835039 9801_ $$aFullTexts
000835039 980__ $$aI:(DE-82)080009_20140620
000835039 980__ $$aI:(DE-82)611110_20170101
000835039 980__ $$aI:(DE-82)611610_20140620
000835039 980__ $$aUNRESTRICTED
000835039 980__ $$aVDB
000835039 980__ $$ajournal