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TY  - JOUR
AU  - Poehls, Leticia Maria Bolzani
AU  - Fieback, M. C. R.
AU  - Hoffmann-Eifert, S.
AU  - Santos Copetti, T.
AU  - Brum, E.
AU  - Menzel, Stephan
AU  - Hamdioui, S.
AU  - Gemmeke, Tobias
TI  - Review of Manufacturing Process Defects and Their Effects on Memristive Devices
JO  - Journal of electronic testing
VL  - 37
IS  - 4
SN  - 1573-0727
CY  - Dordrecht [u.a.]
PB  - Springer Science + Business Media B.V
M1  - RWTH-2021-10244
SP  - 427-437
PY  - 2021
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000709238700001
DO  - DOI:10.1007/s10836-021-05968-8
UR  - https://publications.rwth-aachen.de/record/835039
ER  -