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| 024 | 7 | _ | |2 ISSN |a 0923-8174 |
| 024 | 7 | _ | |2 ISSN |a 1573-0727 |
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| 024 | 7 | _ | |2 datacite_doi |a 10.18154/RWTH-2021-10244 |
| 024 | 7 | _ | |2 doi |a 10.1007/s10836-021-05968-8 |
| 037 | _ | _ | |a RWTH-2021-10244 |
| 041 | _ | _ | |a English |
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| 100 | 1 | _ | |0 P:(DE-82)820257 |a Poehls, Leticia Maria Bolzani |b 0 |e Corresponding author |u rwth |
| 245 | _ | _ | |a Review of Manufacturing Process Defects and Their Effects on Memristive Devices |h online, print |
| 260 | _ | _ | |a Dordrecht [u.a.] |b Springer Science + Business Media B.V |c 2021 |
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| 700 | 1 | _ | |a Fieback, M. C. R. |b 1 |
| 700 | 1 | _ | |0 P:(DE-82)016267 |a Hoffmann-Eifert, S. |b 2 |u rwth |
| 700 | 1 | _ | |0 P:(DE-82)IDM04616 |a Santos Copetti, T. |b 3 |u rwth |
| 700 | 1 | _ | |a Brum, E. |b 4 |
| 700 | 1 | _ | |0 P:(DE-588)1171365098 |a Menzel, Stephan |b 5 |u rwth |
| 700 | 1 | _ | |a Hamdioui, S. |b 6 |
| 700 | 1 | _ | |0 P:(DE-82)IDM01616 |a Gemmeke, Tobias |b 7 |u rwth |
| 773 | _ | _ | |0 PERI:(DE-600)1479776-8 |a 10.1007/s10836-021-05968-8 |n 4 |p 427-437 |t Journal of electronic testing |v 37 |x 1573-0727 |y 2021 |
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