Review of Manufacturing Process Defects and Their Effects on Memristive Devices

Poehls, Leticia Maria Bolzani Fieback, M. C. R. Hoffmann-Eifert, S. Santos Copetti, T. Brum, E. Menzel, Stephan Hamdioui, S. Gemmeke, Tobias

611610 611110 080009

Journal of electronic testing

Springer Science + Business Media B.V

Dordrecht [u.a.]

1573-0727

10.1007/s10836-021-05968-8

English 427-437 4 37 0, ; PUB:(DE-HGF)16, Review Article;

WOS:000709238700001

Journal Article (Review Article)

2021

RWTH-2021-10244

2021

https://publications.rwth-aachen.de/record/835039 https://doi.org/10.1007/s10836-021-05968-8 <Go to ISI>://WOS:000709238700001