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%0 Journal Article
%A Hans, Marcus
%A Czigány, Zsolt
%A Neuß, Deborah
%A Sälker, Janis Alexander
%A Rueß, Holger
%A Krause, Janina
%A Nayak, Ganesh Kumar
%A Holec, David
%A Schneider, Jochen M.
%T Probing the onset of wurtzite phase formation in (V,Al)N thin films by transmission electron microscopy and atom probe tomography
%J Surface and coatings technology
%V 442
%@ 0257-8972
%C Amsterdam [u.a.]
%I Elsevier Science
%M RWTH-2022-06232
%P 128235
%D 2022
%F PUB:(DE-HGF)16 ; PUB:(DE-HGF)7
%9 Journal ArticleContribution to a book
%U <Go to ISI:>//WOS:000822952500001
%R 10.1016/j.surfcoat.2022.128235
%U https://publications.rwth-aachen.de/record/848710