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TY  - CONF
AU  - Sawallich, Simon
AU  - Quellmalz, Arne
AU  - Michalski, Alexander
AU  - Lemme, Max C.
AU  - Nagel, Michael
TI  - High-resolution Terahertz near-field measurements for 2D-material inspection in reflection-mode geometry
CY  - [Piscataway, NJ]
PB  - IEEE
M1  - RWTH-2022-09698
SP  - 1-2
PY  - 2022
T2  - 47. International Conference on Infrared, Millimeter and Terahertz Waves
CY  - 28 Aug 2022 - 2 Sep 2022, Delft (Netherlands)
Y2  - 28 Aug 2022 - 2 Sep 2022
M2  - Delft, Netherlands
LB  - PUB:(DE-HGF)7 ; PUB:(DE-HGF)8
UR  - <Go to ISI:>//WOS:000865953000480
DO  - DOI:10.1109/IRMMW-THz50927.2022.9895998
UR  - https://publications.rwth-aachen.de/record/854660
ER  -