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%0 Journal Article
%A Schnieders, K.
%A Funck, C.
%A Cüppers, F.
%A Aussen, S.
%A Kempen, T.
%A Sarantopoulos, Alexandros
%A Dittmann, R.
%A Menzel, S.
%A Rana, V.
%A Hoffmann-Eifert, S.
%A Wiefels, Stefan
%T Effect of electron conduction on the read noise characteristics in ReRAM devices
%J APL materials
%V 10
%N 10
%@ 2166-532X
%C Melville, NY
%I AIP Publ.
%M RWTH-2022-10081
%P 101114
%D 2022
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000878200200002
%R 10.1063/5.0109787
%U https://publications.rwth-aachen.de/record/855204