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%0 Journal Article
%A Kopperberg, Nils
%A Wiefels, Stefan
%A Hofmann, Karl
%A Otterstedt, Jan
%A Wouters, Dirk J.
%A Waser, Rainer
%A Menzel, Stephan
%T Endurance of 2 mbit based beol integrated reram
%J IEEE access
%V 10
%@ 2169-3536
%C New York, NY
%I Institute of Electrical and Electronics Engineers
%M RWTH-2022-10833
%P 122696-122705
%D 2022
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000892894900001
%R 10.1109/ACCESS.2022.3223657
%U https://publications.rwth-aachen.de/record/856366