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TY  - JOUR
AU  - Kopperberg, Nils
AU  - Wiefels, Stefan
AU  - Hofmann, Karl
AU  - Otterstedt, Jan
AU  - Wouters, Dirk J.
AU  - Waser, Rainer
AU  - Menzel, Stephan
TI  - Endurance of 2 mbit based beol integrated reram
JO  - IEEE access
VL  - 10
SN  - 2169-3536
CY  - New York, NY
PB  - Institute of Electrical and Electronics Engineers
M1  - RWTH-2022-10833
SP  - 122696-122705
PY  - 2022
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000892894900001
DO  - DOI:10.1109/ACCESS.2022.3223657
UR  - https://publications.rwth-aachen.de/record/856366
ER  -