001 | 856366 | ||
005 | 20230404055330.0 | ||
024 | 7 | _ | |a 2169-3536 |2 ISSN |
024 | 7 | _ | |a SCOPUS:2-s2.0-85144007422 |2 SCOPUS |
024 | 7 | _ | |a WOS:000892894900001 |2 WOS |
024 | 7 | _ | |a 10.1109/ACCESS.2022.3223657 |2 doi |
024 | 7 | _ | |a 10.18154/RWTH-2022-10833 |2 datacite_doi |
037 | _ | _ | |a RWTH-2022-10833 |
041 | _ | _ | |a English |
082 | _ | _ | |a 621.3 |
100 | 1 | _ | |0 P:(DE-82)IDM04026 |a Kopperberg, Nils |b 0 |e Corresponding author |u rwth |
245 | _ | _ | |a Endurance of 2 mbit based beol integrated reram |h online |
260 | _ | _ | |a New York, NY |b Institute of Electrical and Electronics Engineers |c 2022 |
336 | 7 | _ | |0 0 |2 EndNote |a Journal Article |
336 | 7 | _ | |0 PUB:(DE-HGF)16 |2 PUB:(DE-HGF) |a Journal Article |b journal |m journal |x Review Article |
336 | 7 | _ | |2 BibTeX |a ARTICLE |
336 | 7 | _ | |2 DRIVER |a article |
336 | 7 | _ | |2 DataCite |a Output Types/Journal article |
336 | 7 | _ | |2 ORCID |a JOURNAL_ARTICLE |
536 | _ | _ | |a DFG project 167917811 - SFB 917: Resistiv schaltende Chalkogenide für zukünftige Elektronikanwendungen: Struktur, Kinetik und Bauelementskalierung "Nanoswitches" (167917811) |0 G:(GEPRIS)167917811 |c 167917811 |x 0 |
536 | _ | _ | |a BMBF-16ME0398K - Verbundprojekt: Neuro-inspirierte Technologien der künstlichen Intelligenz für die Elektronik der Zukunft - NEUROTEC II - (BMBF-16ME0398K) |0 G:(DE-82)BMBF-16ME0398K |c BMBF-16ME0398K |x 1 |
536 | _ | _ | |a BMBF-16ME0399 - Verbundprojekt: Neuro-inspirierte Technologien der künstlichen Intelligenz für die Elektronik der Zukunft - NEUROTEC II - (BMBF-16ME0399) |0 G:(DE-82)BMBF-16ME0399 |c BMBF-16ME0399 |x 2 |
536 | _ | _ | |a BMBF-03ZU1106AB - NeuroSys: "Memristor Crossbar Architekturen (Projekt A) - B" (BMBF-03ZU1106AB) |0 G:(DE-Juel1)BMBF-03ZU1106AB |c BMBF-03ZU1106AB |x 3 |
588 | _ | _ | |a Dataset connected to CrossRef, Journals: publications.rwth-aachen.de |
591 | _ | _ | |a Germany |
653 | _ | 7 | |a Endurance |
653 | _ | 7 | |a KMC |
653 | _ | 7 | |a OxRAM |
653 | _ | 7 | |a RESET Failure |
653 | _ | 7 | |a ReRAM |
653 | _ | 7 | |a Stuck at SET |
653 | _ | 7 | |a VCM |
700 | 1 | _ | |0 P:(DE-82)IDM02557 |a Wiefels, Stefan |b 1 |
700 | 1 | _ | |a Hofmann, Karl |b 2 |
700 | 1 | _ | |a Otterstedt, Jan |b 3 |
700 | 1 | _ | |0 P:(DE-82)057959 |a Wouters, Dirk J. |b 4 |u rwth |
700 | 1 | _ | |0 P:(DE-82)IDM01464 |a Waser, Rainer |b 5 |u rwth |
700 | 1 | _ | |0 0000-0002-4258-2673 |a Menzel, Stephan |b 6 |
773 | _ | _ | |0 PERI:(DE-600)2687964-5 |a 10.1109/ACCESS.2022.3223657 |p 122696-122705 |t IEEE access |v 10 |x 2169-3536 |y 2022 |
856 | 4 | _ | |u https://publications.rwth-aachen.de/record/856366/files/856366.pdf |y OpenAccess |
909 | C | O | |o oai:publications.rwth-aachen.de:856366 |p openaire |p open_access |p VDB |p driver |p dnbdelivery |
910 | 1 | _ | |0 I:(DE-588b)36225-6 |6 P:(DE-82)IDM04026 |a RWTH Aachen |b 0 |k RWTH |
910 | 1 | _ | |0 I:(DE-588b)36225-6 |6 P:(DE-82)057959 |a RWTH Aachen |b 4 |k RWTH |
910 | 1 | _ | |0 I:(DE-588b)36225-6 |6 P:(DE-82)IDM01464 |a RWTH Aachen |b 5 |k RWTH |
914 | 1 | _ | |y 2022 |
915 | 1 | _ | |0 StatID:(DE-HGF)0031 |2 StatID |a Peer reviewed article |x 0 |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0150 |2 StatID |b Web of Science Core Collection |d 2022-11-11 |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0300 |2 StatID |b Medline |d 2022-11-11 |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)1160 |2 StatID |b Current Contents - Engineering, Computing and Technology |d 2022-11-11 |
915 | _ | _ | |a Creative Commons Attribution CC BY 4.0 |0 LIC:(DE-HGF)CCBY4 |2 HGFVOC |
915 | _ | _ | |a JCR |0 StatID:(DE-HGF)0100 |2 StatID |b IEEE ACCESS : 2021 |d 2022-11-11 |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0501 |2 StatID |b DOAJ Seal |d 2022-06-13T11:44:26Z |
915 | _ | _ | |a WoS |0 StatID:(DE-HGF)0113 |2 StatID |b Science Citation Index Expanded |d 2022-11-11 |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0500 |2 StatID |b DOAJ |d 2022-06-13T11:44:26Z |
915 | _ | _ | |a Fees |0 StatID:(DE-HGF)0700 |2 StatID |d 2022-11-11 |
915 | _ | _ | |a OpenAccess |0 StatID:(DE-HGF)0510 |2 StatID |
915 | _ | _ | |a IF < 5 |0 StatID:(DE-HGF)9900 |2 StatID |d 2022-11-11 |
915 | _ | _ | |a Peer Review |0 StatID:(DE-HGF)0030 |2 StatID |b DOAJ : Blind peer review |d 2021-01-28 |
915 | _ | _ | |a Article Processing Charges |0 StatID:(DE-HGF)0561 |2 StatID |d 2022-11-11 |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)1230 |2 StatID |b Current Contents - Electronics and Telecommunications Collection |d 2022-11-11 |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0160 |2 StatID |b Essential Science Indicators |d 2022-11-11 |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0200 |2 StatID |b SCOPUS |d 2022-11-11 |
915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0199 |2 StatID |b Clarivate Analytics Master Journal List |d 2022-11-11 |
920 | 1 | _ | |0 I:(DE-82)611610_20140620 |k 611610 |l Lehrstuhl für Werkstoffe der Elektrotechnik II und Institut für Werkstoffe der Elektrotechnik |x 0 |
920 | 1 | _ | |0 I:(DE-82)080009_20140620 |k 080009 |l JARA-FIT |x 1 |
980 | _ | _ | |a I:(DE-82)080009_20140620 |
980 | _ | _ | |a I:(DE-82)611610_20140620 |
980 | _ | _ | |a UNRESTRICTED |
980 | _ | _ | |a VDB |
980 | _ | _ | |a journal |
980 | 1 | _ | |a FullTexts |
Library | Collection | CLSMajor | CLSMinor | Language | Author |
---|